Thomas Eckes – Introduction to Many-Facet Rasch Measurement Analyzin – X555z

Thomas Eckes – Introduction to Many-Facet Rasch Measurement Analyzin – X555z

USD 83.90 USD
SKU: hZxplWQV
Brand: Language Testing and Evaluation
GTIN: 9783631656150
Condition: Brand New
Categories: Books & Magazines

Specifications

Fiction/Non-FictionNon-Fiction
Weight0.48
Record GradingNew
Sleeve GradingNew
UPC9783631656150
EAN9783631656150
ISBN9783631656150

2nd Revised and Updated Edition : 22. Books are released in many editions and variations, such as standard edition, re-issue, not for sale, promotional, special edition, limited edition, and many other editions and versions.

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